Hivatkozási szám

MSZ EN 60749-40:2012

Dokumentumazonosító

153212

Cím

Félvezető eszközök. Mechanikai és klimatikus vizsgálati módszerek. 40. rész: Az áramköri lap ejtegetéses vizsgálata nyúlásmérő bélyeggel (IEC 60749-40:2011)

Angol cím

Semiconductor devices. Mechanical and climatic test methods. Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011)

Alkalmazási terület

This part of IEC 60749 is intended to evaluate and compare drop performance of a surface mount semiconductor device for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize test methodology to provide a reproducible assessment of the drop test performance of a surface mounted semiconductor devices while duplicating the failure modes normally observed during product level test. This international standard uses a strain gauge to measure the strain and strain rate of a board in the vicinity of a component. Test method IEC 60749-37 uses an accelerometer to measure the mechanical shock duration and magnitude applied which is proportional to the stress on a given component mounted on a standard board. The detailed specification shall state which test method is to be used. NOTE 1 Although this test can evaluate a structure where the mounting method and its conditions, the design of a printed wired board, solder material, the mounting capability of a semiconductor device, etc. are combined, it does not solely evaluate the mounting capability of a semiconductor device. NOTE 2 The result of this test is strongly influenced by the differences between soldering conditions, the design of the land pattern of a printed wired board, solder material, etc. Therefore, in carrying out this test, it is necessary to recognize that this test cannot intrinsically guarantee the reliability of the solder joint of the semiconductor devices. NOTE 3 When the mechanical stress which is generated by this test does not occur in the actual application of the device, implementation of this test is unnecessary.

ICS

31.080.01 Félvezető eszközök általában

Műszaki Bizottság

A szabvány nyelve

angol

Az érvényesség kezdete

2012-03-01

Forrás

idt IEC 60749-40:2011; idt EN 60749-40:2011

Előd

Utód

Módosítás

Kiegészítő információk

SZK-közlemények

Kapcsolódó európai jogszabály

A szabvány

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